granted to
Samuel HartmannA ABB Switzerland Ltd. Lenzburg, Switzerland |
|
granted to
Jens Goehre Fraunhofer Institute IZM, Berlin, Germany |
in recognition of the outstanding paper presented at the CIPS 2010
Observation of Chip Solder Degradation by Electrical Measurements during Power Cycling |
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in recognition of the outstanding paper presented at the CIPS 2010
Interface Degradation of Al Heavy Wire Bonds on Power Semiconductors during Active Power Cycling Measured by the Shear Test |