Download Call for Papers
The Call for Papers is available as a PDF file:
Abstract Information
Abstract quality will be the basis for selection of conference presentations. The abstracts will be assessed for:
Therefore, we highly recommend that your abstract contains enough detail to clearly describe the content of your presentation. The abstracts should include at least one full page of text (minimum of 1000 words), the use of figures is encouraged.
Commercial papers, papers with no new research / development content, and papers where significant information is missing will not be accepted. All accepted abstracts will be printed, bound and handed out to the participants of the conference.
Deadline for abstracts: April 19th, 2013
By submitting an abstract you agree to
Authors will be notified of the acceptance of their submissions by May 3rd, 2013; further manuscript format and layout instructions will be provided at that time.
Manuscripts
Please, send the original of the manuscript a.s.a.p.
As to further information concerning the submission procedure, please have a look at our homepage, www.emlc2013.com
Deadline for Manuscripts: June 14th, 2013
All manuscripts will be subject to a critical peer review before they are accepted for publication in the SPIE Digital Library.
Please note: Late submissions may not be published.
Information on the format of the manuscripts and further details is also provided at the conference web site: www.emlc2013.com
The conference manuscripts will be published by SPIE
Conference Topics
Presentations are solicited for the following and related topics:
Mask Manufacturing
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Mask Data Preparation
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Pattern Generation: Writing, Etch, etc.
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Photomask Processes & Materials
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Metrology Tools & Technologies
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Defect Inspection & Repair
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Cleaning & Haze
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Pellicles & Mask Boxes
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Mask Process Yield & Cycle Time
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Photomasks for RET & OPC; PSM
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Masks for NGL: E-Beam, EUV, NIL, etc.
Mask Business
Lithography and Mask Application
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Double Patterning
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RET, OPC, PSM, MEEF
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Resist
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Mask Defect Printability
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Optical Materials
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Immersion Lithography
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Immersion Defectivity
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Alternate Immersion Fluids
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Lithography Process Control
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Lithography Simulation
Emerging Mask and Lithography Technologies
Mask and Lithography Equipment
Semiconductors applied in Automotive NEW !!
Semiconductors in MEMS Automotive NEW !!
Patterned Media NEW !!