Instustry Workshop 

ESREF 2016 

27th EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES,
FAILURE PHYSICS AND ANALYSIS

Workshop: “Failure Analysis with Nanoprobing, EBIC and EBAC”

The workshop brings together Fraunhofer CAM, Imina Technologies SA and Point Electronic GmbH to present and discuss recent developments in EBIC/EBAC characterization in combination with Nanoprobing. A range of investigation cases will be discussed with the inputs of experts in both domains. The event will end with a hands-on analysis at Fraunhofer's lab.

Please register before September 14th, 2016 via email to Katja.Stock@imws.fraunhofer.de

Programme - Click here

 

Workshop: “Extend analysis capabilities with Omniprobe solutions”

Fraunhofer CAM and Oxford Instruments will present and discuss recent developments in failure analysis and characterization including TEM sample preparation, nanowire analysis and EBIC/EBAC analysis. A range of investigation cases will be discussed with the inputs of experts in both domains. The event will end with a hands-on analysis at Fraunhofer's lab.
The workshop will take place on Thursday, 22.09.2016 at Fraunhofer CAM, Heideallee 19, Halle.

Participation is free of charge, but participants need to register.

Please register via email to Katja.Stock@imws.fraunhofer.de

Programme - Click here

 

Fraunhofer Lab Tour:

Come and join us on a tour of the Fraunhofer labs here in Halle. The tours will give you an insight into our work and our facilities.

The tours will take place on Thursday, September 22nd 2016, 16:30 at Fraunhofer CAM, Heideallee 19, Halle.

Participation is free of charge, but participants need to register.

Please register via email to Katja.Stock@imws.fraunhofer.de

Full details of the tours, can be found here

 
 
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