The conference will concentrate on electronic systems and devices with specific relevance for European and international industry, such as
• Automotive electronics reliability (focus topic)
• Reliability of nano- and microelectronics for the connected world
• Reliability of power electronics for energy efficiency and industrial applications
• Reliability of photonics and MEMS devices
• Security and safety
• Innovative failure diagnostics and quality control
• Reliability concepts and modelling
The following conference tracks and sessions are planned for ESREF 2016:
A: Quality and Reliability Assessment –Techniques and Methods for Devices & Systems
B: Semiconductor Reliability and Failure Mechanisms
C: Reliability and Failure Mechanisms in Packaging and Assembly
D: Progress in Failure Analysis Methods
E: Power Devices Reliability
F: Reliability and Failure Mechanisms of Wide Bandgap Devices
G: Reliability and Failure Mechanisms of special photonics and LED Devices
H: Reliability and Failure Mechanisms of MEMS and sensor Systems
The CAM/EUFANET-industry workshop will bring together experts including leading automotive OEMs, semiconductor industry and failure analysis equipment manufacturers to present latest achievements in results, methods and instrumentation and to discuss current and upcoming technological needs (invited industry talks only).
Additional workshops and tutorials are planned for the conference.