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Best Papers 

ESREF 2014 

25th EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES,
FAILURE PHYSICS AND ANALYSIS

The following papers received an award at ESREF 2014


Best Paper for paper exchange with IRPS 2015

HCS Degradation of 5nm Oxide High-Voltage PLDMOS
Christina Olk, Stefano Aresu, Ralf Rudolf, Michael Röhner, Wolfgang Gustin
Infineon, Germany


Best Paper for papers exchange with IPFA 2015

Study of Thermal Cycling and Temperature Aging on PbSnAg Die Attach Solder Joints for High Power Modules
Franc Dugal1, Mauro Ciappa2
1 ABB, Switzerland; 2 ETH Zurich, Switzerland


Best Paper for paper exchange with ISTFA 2015

Advanced FIB sample preparation techniques for high resolution TEM investigations of HEMT device structures
Michél Simon-Najasek1, Frank Altmann1, Susanne Hübner1, Andreas Graff1
and Helmut Jung2
1 Fraunhofer Institute for Mechanics of Materials IWM, Germany; 2 United Monolithic Semiconductors GmbH, Germany


Best Poster Award

Compact model of magnetic tunnel junction with stochastic spin transfer torque switching for reliability analyses
You Wang1, Yue Zhang1, Erya Deng1, Jacques-Olivier Klein1,
Lirida Alves De Barros Naviner2, Weisheng Zhao1
1 Univ. Paris-Sud, France; 2 Institut TELECOM, Télécom ParisTech, France

 
 
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