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Tutorials 

ESREF 2014 

25th EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES,
FAILURE PHYSICS AND ANALYSIS

TUTORIALS

Organic Semiconductors: Novel Materials for Optoelectronic Application
Selina Olthof (University Köln, GER)
Jens Meyer (Philips Research, Aachen, GER)

Drift and Reliability Mechanisms in GaN based Power Devices for high Voltage Switching Applications: The current Understanding
Hans-Joachim Würfl (FBH, Berlin, GER)

Managing the Effects of Mechanical Stress in 3D-integrated Systems
Ehrenfried Zschech (FhG IZFP, Dresden, GER)
Valeriy Sukharev (Mentor Graphics, Fremont CA, USA)
Riko Radojcic (Qualcomm, San Diego CA, USA)

Asking the right Questions (be)for(e) Failure Analysis
Peter Jacob (EMPA, Zürich, CHE)

 
 
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