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Invited Talks 

ESREF 2014 

25th EUROPEAN SYMPOSIUM ON RELIABILITY OF ELECTRON DEVICES,
FAILURE PHYSICS AND ANALYSIS

INVITED TALKS

Lifetime Modeling and Simulation of Power Modules for Hybrid Electrical / Electrical Vehicles
Markus Thoben (Infineon, GER)

Massive Scale Organic Photovoltaic Manufacture
Frederik Christian Krebs (Tech. Univ. of Denmark, Roskilde, DK)

Robustness Validation – A Physics of Failure Based Approach to Qualification
Werner Kanert (Infineon, GER)

Performance – Reliability Trade-Offs for High-K RRAM
Nagarajan Raghavan (Singapore Univ. of Techn. and Design, SIN)

Enabling Higher Fault Isolation Resolution through Advanced Optics
Derryck Reid (Heriot-Watt University, UK)

Reliability of Wafer Level Chip Scale Packages
René Rongen (NXP Semiconductors, Nijmegen, NLD)

MEMS Reliability – Current Status and Challenges
Mervi Paulasto-Kröckel (University Aalto, FIN)
Jue Li (University Aalto, FIN)

Precise Nanofabrication with Multiple Ion Beams for Advanced Circuit Edit
Huimeng Wu (Carl Zeiss LLC, Peabody MA, USA)

 
 
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